<div class="content"><p><b>Abstract</b><br />In an apparatus for EMC testing of electrical devices, conductors are arranged at opposite sides of a chamber of conductive material at a spacing from and parallel to the chamber walls. These conductors form a symmetrical double line and are fed out of phase at one end by a radio frequency source. They are electrically connected to the chamber walls at the other end via terminating impedances.</p><p><a href="http://www.google.com/patents/pdf/Apparatus_for_EMC_testing_of_electrical_.pdf?id=-3AZAAAAEBAJ&output=pdf&sig=uXEnOajH9BN_FD0Nz4ajR6BdG_w"><font color="#336699">Apparatus for EMC testing of electrical devices（美国EMC技术专利）</font></a></p></div>
|小黑屋|电磁兼容网 电磁兼容小小家 EMC工程师家园 电磁兼容(EMC)小小家学习园地
发表于 2007-9-18 08:57:07
