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发表于 2009-2-20 17:15:58
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14-2 A2:2008 更改的部分
1 Scope and object
Replace the title of this clause by “Scope”
1.1 In the third paragraph, replace “CISPR 14” by “CISPR 14-1”.
Page 11
2 Normative references
Replace the text by the following:
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60050-161, International Electrotechnical Vocabulary (IEV) – Chapter 161:
Electromagnetic compatibility
CISPR 14-2 Amend. 2 © IEC:2008 – 3 –
IEC 61000-4-2:1995, Electromagnetic compatibility (EMC) – Part 4-2: Testing and
measurement techniques – Electrostatic discharge immunity test
Amendment 1:1998
Amendment 2:20001
IEC 61000-4-3:2006, Electromagnetic compatibility (EMC) – Part 4-3: Testing and
measurement techniques – Radiated, radio-frequency, electromagnetic field immunity test
Amendment 1:20072
IEC 61000-4-4:2004, Electromagnetic compatibility (EMC) – Part 4-4: Testing and
measurement techniques – Electrical fast transient/burst immunity test
IEC 61000-4-5:2005, Electromagnetic compatibility (EMC) – Part 4-5: Testing and
measurement techniques – Surge immunity test
IEC 61000-4-6:2003, Electromagnetic compatibility (EMC) – Part 4-6: Testing and
measurement techniques – Immunity to conducted disturbances, induced by radio-frequency
fields
Amendment 1:2004
Amendment 2:20063
IEC 61000-4-11:2004, Electromagnetic compatibility (EMC) – Part 4-11: Testing and
measurement techniques – Voltage dips, short interruptions and voltage variations immunity tests
CISPR 14-1:2005, Electromagnetic compatibility – Requirements for household appliances,
electric tools and similar apparatus – Part 1: Emission
Page 13
3 Definitions
Replace the title of this clause by “Terms and definitions”.
Replace the first paragraph by the following:
For the purposes of this document, the terms and definitions related to EMC and related
phenomena found in IEC 60050-161, as well as the following terms and definitions apply.
Add the following new definition:
3.18
clock frequency
fundamental frequency of any signal used in the device, excluding those which are solely
used inside integrated circuits (IC)
NOTE High frequencies are often generated inside of integrated circuits (IC) by phase-locked-loop (PLL) circuits
from lower clock oscillator frequencies outside the IC.
___________
1 There exists a consolidated edition 1.2 (2001) that includes edition 1 and its Amendments 1 and 2.
2 There exists a consolidated edition 3.1 (2008) that includes edition 3 and its Amendment 1.
3 There exists a consolidated edition 2.2 (2006) that includes edition 2 and its Amendments 1 and 2.
– 4 – CISPR 14-2 Amend. 2 © IEC:2008
Page 13
4 Classification of apparatus
4.2 Delete Note 1 and renumber Note 2, introduced by Amendment 1, as NOTE.
Page 15
5 Tests
Throughout the clause, including the tables, replace “IEC 1000” by “IEC 61000”.
Page 21
5.6 Surges
Table 12 – Input a.c. power ports
In the second column after 2 kV add "Line-to-Earth with 12 Ω Impedance" and after 1 kV add
"Line-to-Line with 2 Ω Impedance".
After Table 12, add the following paragraph as a new second paragraph:
The positive pulses are applied 90° relative to the phase angle of the a.c. line voltage to the
equipment under test, and the negative pulses are applied 270° relative to the phase angle of
the a.c. line voltage to the equipment under test. Tests with other (lower) voltages than those
given in Table 12 are not required.
5.7 Voltage dips and interruptions
Table 13 – Input a.c. power ports
Replace the existing Table 13 by the following new Table 13:
Table 13 – Input a.c. power ports
Durations for voltage dips
Environmental Test set-up
phenomena
Test level
in % UT
50 Hz 60 Hz
Voltage dips
in % UT
100
60
30
0
40
70
0,5 cycle
10 cycles
25 cycles
0,5 cycle
12 cycles
30 cycles
IEC 61000-4-11
Voltage change shall
occur at zero crossing
UT is the rated voltage of the equipment under test.
CISPR 14-2 Amend. 2 © IEC:2008 – 5 –
Page 27
8 Conditions during testing
8.1 Replace the first paragraph by the following paragraph:
Unless otherwise specified, the tests shall be made while the apparatus is operated as
intended by the manufacturer, in the most susceptible operating mode consistent with normal
use.
8.4 Delete the second sentence.
8.7 Delete this subclause.
8.8 Renumber this subclause as 8.7
Page 29
9 Assessment of conformity
9.2 Statistical evaluation
Replace the existing Note by the following:
NOTE For general information on the statistical consideration in the determination EMC compliance, see
CISPR/TR 16-4-3.
Page 31
10 Product documentation
Delete this clause.
Bibliography
Replace the reference to CISPR 16-2, introduced by Amendment 1, by the following reference:
CISPR/TR 16-4-3, Specification for radio disturbance and immunity measuring apparatus and
methods – Part 4-3: Uncertainties, statistics and limit modelling – Statistical considerations in
the determination of EMC compliance of mass-produced products (only available in English)
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